In-line, non-destructive techniques are preferred, often using electromagnetic radiation to measure parameters like layer thickness, composition, and conductivity.
Key methods include spectral ellipsometry, Raman spectroscopy, reflectometry, and eddy current measurements.
Standards development is ongoing to establish testing protocols specific to printed electronics. Effective testing enables process optimization and helps meet application-specific requirements.
Implementation example
In-line interferometer solutions
An in-line wavelength selective interferometer for measuring surface topography at the micro- and nanoscales. By capturing pixel by pixel data, sharp changes in height can be measured, such as steps or trenches.
Web guide system
Web guide system with an integrated camera, designed for precise alignment and monitoring in roll-to-roll processing.